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DM 170 - Backscatter dust measurement

DM 170 is a backscatter particulate measurement sensor for measuring dust concentrations

  • is designed to comply with the TÜV suitability testing scheme to EN 15267
  • for measuring dust concentrations in a wide range of industrial applications
  • may be used in combustion applications as well as in higher dust loading applications
  • ideally suited for process opimisation applications
  • ProScatter Backscatter sensor technology with superior minimum detection level as low as 1 mg/m3
  • manual and remote Zero and Span (reference) checks available to ensure optimal instrument performance
  • purge Flow Fail Sensor and Optical Shield options
  • non-intrusive system designed to operate in non-condensing stack environments
  • contamination risks are further reduced due to single-side stack installation where critical optical components remain outside the stack
  • offers a more reliable PM dust measurement as an alternative to opacity and scintillation



The DM 170 is well-suited for use in medium to large stacks and is suitable for low to high dust concentration measurements, regardless of dust velocity or charge. Typical applications include:

  • Continuous Emission Monitoring (CEM) relative to Emission Limit Values (ELV) in Power Plant, Boiler and Metal Smelting applications
  • Filter performance monitoring in Metal, Mineral and Chemical plant


The DM 170 is based on PCME’s class-leading ProScatter Backscatter technology.

Particles in the stack are illuminated by a laser and the amount of laser-light scattered back from the particles is measured by a detector. Stray scattering and ambient light are eliminated by tuning the instrument’s field-of-view and by use of a modulated laser source. The instrument response is proportional to dust concentration.
It can be calibrated to provide a mg/m3 measurement by comparison to results of a standard reference (isokinetic) test. With the ability to measure dust levels as low as 1 mg/m3, the DM 170 can be used in applications where emissions are well below the sensitivity limit of traditional Opacity instruments.

Technical Data

Application examples

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